Using transmission electron microscopy (TEM) to complement powder diffraction data
نویسندگان
چکیده
منابع مشابه
Electron Diffraction Using Transmission Electron Microscopy
Electron diffraction via the transmission electron microscope is a powerful method for characterizing the structure of materials, including perfect crystals and defect structures. The advantages of electron diffraction over other methods, e.g., x-ray or neutron, arise from the extremely short wavelength (≈2 pm), the strong atomic scattering, and the ability to examine tiny volumes of matter (≈1...
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The transmission electron microscope (TEM) is an invaluable tool for the characterization of crystals, polycrystalline materials, biological specimens, nanostructures etc. It provides a wide range of different imaging modes with the ability to provide information on elemental composition and electronic structure at the ultimate sensitivity, that of a single atom. Convergent beam electron diffra...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 2005
ISSN: 0108-7673
DOI: 10.1107/s010876730508092x